Name: Assessing Fault Model and Test Quality (en Inglés)
Price: 180530.00 CLP
Availability: InStock
Author: Butler, Kenneth M. ; Mercer, M. Ray
ISBN: 9781461366027

portada Assessing Fault Model and Test Quality (en Inglés)

Formato

Libro Físico

Autor

Kenneth M. Butler

M. Ray Mercer

Editorial

Springer

Idioma

Inglés

N° páginas

132

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 0.8 cm

Peso

0.23 kg.

ISBN13

9781461366027

Categorías

Cam: manufactura asistida por ordenador
Ingeniería eléctrica
Electrónica: circuitos y componentes
Diseño asistido por ordenador (cad)

Assessing Fault Model and Test Quality (en Inglés)

Kenneth M. Butler (Autor) · M. Ray Mercer (Autor) · Springer · Tapa Blanda

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Reseña del libro "Assessing Fault Model and Test Quality (en Inglés)"

For many years, the dominant fault model in automatic test pattern gen- eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques- tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or- dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex- ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa- tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight- forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.