Name: Introduction to Quantum Metrology: Quantum Standards and Instrumentation (en Inglés)
Price: 253990.00 CLP
Availability: InStock
Author: Nawrocki, Waldemar
ISBN: 9783319384795

portada Introduction to Quantum Metrology: Quantum Standards and Instrumentation (en Inglés)

Formato

Libro Físico

Autor

Waldemar Nawrocki

Editorial

Springer

Año

2016

Idioma

Inglés

N° páginas

279

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 1.6 cm

Peso

0.42 kg.

ISBN13

9783319384795

Categorías

Normas científicas
Nanociencias
Nanotecnología

Introduction to Quantum Metrology: Quantum Standards and Instrumentation (en Inglés)

Waldemar Nawrocki (Autor) · Springer · Tapa Blanda

Libro Nuevo

$ 253.990

$ 352.770

Ahorras: $ 98.780

28% descuento

Envío normal

Origen: Estados Unidos (Costos de importación incluídos en el precio)

Se enviará desde nuestra bodega entre el Jueves 16 de Mayo y el Lunes 27 de Mayo.

Lo recibirás en cualquier lugar de Chile entre 1 y 3 días hábiles luego del envío.

Reseña del libro "Introduction to Quantum Metrology: Quantum Standards and Instrumentation (en Inglés)"

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.