Name: Introduction to Statistics in Metrology (en Inglés)
Price: 172800.00 CLP
Availability: InStock
Author: Crowder, Stephen ; Delker, Collin ; Forrest, Eric
ISBN: 9783030533281

portada Introduction to Statistics in Metrology (en Inglés)

Formato

Libro Físico

Autor

Editorial

Año

2020

Idioma

Inglés

N° páginas

347

Encuadernación

Tapa Dura

Dimensiones

23.4 x 15.6 x 2.2 cm

Peso

0.69 kg.

ISBN13

9783030533281

N° edición

Categorías

Probabilidad y estadística
Instrumentos e instrumentación
Ingeniería eléctrica

Introduction to Statistics in Metrology (en Inglés)

Stephen Crowder (Autor) · Collin Delker (Autor) · Eric Forrest (Autor) · Springer · Tapa Dura

Libro NuevoOrigen: España *

Envío: 13 a 18 días háb.

$ 314.190$ 172.800

-45%

* (Costos de importación incluídos en el precio)

Libro Nuevo

Quedan 50 unidades

$ 172.800

Se enviará desde nuestra bodega entre el Martes 15 de Abril y el Miércoles 23 de Abril

Calcula el costo de envío

Agregar a lista de deseos

Reseña del libro "Introduction to Statistics in Metrology (en Inglés)"

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.