Compartir
Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (en Inglés)
Cor Claeys
(Autor)
·
Eddy Simoen
(Autor)
·
Springer
· Tapa Blanda
Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (en Inglés) - Claeys, Cor ; Simoen, Eddy
$ 329.310
$ 457.370
Ahorras: $ 128.060
Elige la lista en la que quieres agregar tu producto o crea una nueva lista
✓ Producto agregado correctamente a la lista de deseos.
Ir a Mis Listas
Origen: Estados Unidos
(Costos de importación incluídos en el precio)
Se enviará desde nuestra bodega entre el
Miércoles 07 de Agosto y el
Lunes 19 de Agosto.
Lo recibirás en cualquier lugar de Chile entre 1 y 3 días hábiles luego del envío.
Reseña del libro "Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (en Inglés)"
This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
