Name: Phase Noise and Frequency Stability in Oscillators Paperback (The Cambridge rf and Microwave Engineering Series) (en Inglés)
Price: 123010.00 CLP
Availability: InStock
Author: Rubiola, Enrico
ISBN: 9780521153287

portada Phase Noise and Frequency Stability in Oscillators Paperback (The Cambridge rf and Microwave Engineering Series) (en Inglés)

Phase Noise and Frequency Stability in Oscillators Paperback (The Cambridge rf and Microwave Engineering Series) (en Inglés)

Formato

Libro Físico

Autor

Enrico Rubiola

Editorial

Cambridge University Press

Año

2010

Idioma

Inglés

N° páginas

228

Encuadernación

Tapa Blanda

Dimensiones

24.4 x 17.0 x 1.2 cm

Peso

0.37 kg.

ISBN

052115328X

ISBN13

9780521153287

N° edición

Categorías

Electrónica: circuitos y componentes
Tecnología de microondas

Phase Noise and Frequency Stability in Oscillators Paperback (The Cambridge rf and Microwave Engineering Series) (en Inglés)

Enrico Rubiola (Autor) · Cambridge University Press · Tapa Blanda

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Reseña del libro "Phase Noise and Frequency Stability in Oscillators Paperback (The Cambridge rf and Microwave Engineering Series) (en Inglés)"

Presenting a comprehensive account of oscillator phase noise and frequency stability, this practical text is both mathematically rigorous and accessible. An in-depth treatment of the noise mechanism is given, describing the oscillator as a physical system, and showing that simple general laws govern the stability of a large variety of oscillators differing in technology and frequency range. Inevitably, special attention is given to amplifiers, resonators, delay lines, feedback, and flicker (1/f) noise. The reverse engineering of oscillators based on phase-noise spectra is also covered, and end-of-chapter exercises are given. Uniquely, numerous practical examples are presented, including case studies taken from laboratory prototypes and commercial oscillators, which allow the oscillator internal design to be understood by analyzing its phase-noise spectrum. Based on tutorials given by the author at the Jet Propulsion Laboratory, international IEEE meetings, and in industry, this is a useful reference for academic researchers, industry practitioners, and graduate students in RF engineering and communications engineering.