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Surface Plasmon Resonance Sensors: A Materials Guide to Design, Characterization, Optimization, and Usage (Springer Series in Surface Sciences) (en Inglés)
Leiva Casemiro Oliveira; Antonio Marcus Nogueira Lima; Carsten Thirstrup; Helmut Franz Neff (Autor)
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Springer
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Surface Plasmon Resonance Sensors: A Materials Guide to Design, Characterization, Optimization, and Usage (Springer Series in Surface Sciences) (en Inglés) - Leiva Casemiro Oliveira; Antonio Marcus Nogueira Lima; Carsten Thirstrup; Helmut Franz Neff
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Origen: Estados Unidos
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Reseña del libro "Surface Plasmon Resonance Sensors: A Materials Guide to Design, Characterization, Optimization, and Usage (Springer Series in Surface Sciences) (en Inglés)"
This significantly extended second edition addresses the important physical phenomenon of Surface Plasmon Resonance (SPR) or Surface Plasmon Polaritons (SPP) in thin metal films, a phenomenon which is exploited in the design of a large variety of physico-chemical optical sensors. In this treatment, crucial materials aspects for design and optimization of SPR sensors are investigated and described in detail. The text covers a selection of nanometer thin metal films, ranging from free-electron to the platinum-type conductors, along with their combination with a large variety of dielectric substrate materials, and associated individual layer and opto-geometric arrangements. Whereas the first edition treated solely the metal-liquid interface, the SP-resonance conditions considered here are expanded to cover the metal-gas interface in the angular and wavelength interrogation modes, localized and long-range SP's and the influence of native oxidic ad-layers in the case of non-noble metals. Furthermore, a selection of metal grating structures that allow SP excitation is presented, as are features of radiative SP's. Finally, this treatise includes as-yet hardly explored SPR features of selected metal–metal and metal–dielectric superlattices. An in-depth multilayer Fresnel evaluation provides the mathematical tool for this optical analysis, which otherwise relies solely on experimentally determined electro-optical materials parameters.
