Compartir
Test and Diagnosis of Analogue, Mixed-Signal and rf Integrated Circuits: The System on Chip Approach (Materials, Circuits and Devices) (en Inglés)
Yichuang (Edt) Sun (Autor)
·
The Institution Of Engineering And Technology
· Tapa Blanda
Test and Diagnosis of Analogue, Mixed-Signal and rf Integrated Circuits: The System on Chip Approach (Materials, Circuits and Devices) (en Inglés) - yichuang (edt) sun
$ 204.890
$ 284.570
Ahorras: $ 79.680
Elige la lista en la que quieres agregar tu producto o crea una nueva lista
✓ Producto agregado correctamente a la lista de deseos.
Ir a Mis Listas
Origen: Estados Unidos
(Costos de importación incluídos en el precio)
Se enviará desde nuestra bodega entre el
Lunes 20 de Mayo y el
Miércoles 29 de Mayo.
Lo recibirás en cualquier lugar de Chile entre 1 y 3 días hábiles luego del envío.
Reseña del libro "Test and Diagnosis of Analogue, Mixed-Signal and rf Integrated Circuits: The System on Chip Approach (Materials, Circuits and Devices) (en Inglés)"
Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
