Name: Advances in X-Ray Analysis (en Inglés)
Price: 521420.00 CLP
Availability: InStock
Author: T. C. Huang
ISBN: 9780306450457

portada Advances in X-Ray Analysis (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

T. C. Huang

Año

1995

Idioma

Inglés

N° páginas

787

Encuadernación

Tapa Dura

ISBN

0306450453

ISBN13

9780306450457

N° edición

1995

Categorías

Cuestiones generales de la medicina

Advances in X-Ray Analysis (en Inglés)

T. C. Huang (Autor) · Springer · Tapa Dura

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Reseña del libro "Advances in X-Ray Analysis (en Inglés)"

The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up.