Compartir
Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology (Micro and Nano Technologies) (en Inglés)
Petr Klapetek (Autor)
·
Elsevier
· Tapa Blanda
Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology (Micro and Nano Technologies) (en Inglés) - Petr Klapetek
$ 180.380
$ 360.760
Ahorras: $ 180.380
Elige la lista en la que quieres agregar tu producto o crea una nueva lista
✓ Producto agregado correctamente a la lista de deseos.
Ir a Mis Listas
Origen: Reino Unido
(Costos de importación incluídos en el precio)
Se enviará desde nuestra bodega entre el
Viernes 21 de Junio y el
Miércoles 03 de Julio.
Lo recibirás en cualquier lugar de Chile entre 1 y 3 días hábiles luego del envío.
Reseña del libro "Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology (Micro and Nano Technologies) (en Inglés)"
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracyWorked examples show quantitative data processing for different SPM analytical techniques
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
Todos los libros de nuestro catálogo son Originales.
El libro está escrito en Inglés.
La encuadernación de esta edición es Tapa Blanda.
✓ Producto agregado correctamente al carro, Ir a Pagar.