Name: Quantum Metrology With Photoelectrons: Volume ii: Applications and Advances (Iop Concise Physics) (en Inglés)
SKU: 51240316
Price: 83630.00 CLP
Availability: InStock
Author: Paul Hockett

portada Quantum Metrology With Photoelectrons: Volume ii: Applications and Advances (Iop Concise Physics) (en Inglés)

Quantum Metrology With Photoelectrons: Volume ii: Applications and Advances (Iop Concise Physics) (en Inglés)

Formato

Libro Físico

Editorial

Morgan & Claypool

Autor

Paul Hockett

Año

2018

Idioma

Inglés

N° páginas

125

Encuadernación

Tapa Blanda

ISBN13

9781681746890

Categorías

Física cuántica (mecánica cuántica y teoría cuántica de campos)

Quantum Metrology With Photoelectrons: Volume ii: Applications and Advances (Iop Concise Physics) (en Inglés)

Paul Hockett (Autor) · Morgan & Claypool · Tapa Blanda

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Reseña del libro "Quantum Metrology With Photoelectrons: Volume ii: Applications and Advances (Iop Concise Physics) (en Inglés)"

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on "complete" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.