Name: Crosstalk in Modern On-Chip Interconnects: A Fdtd Approach (Springerbriefs in Applied Sciences and Technology) (en Inglés)
Price: 65590.00 CLP
Availability: InStock
Author: B.K. Kaushik; V. Ramesh Kumar; Amalendu Patnaik
ISBN: 9789811007996

portada Crosstalk in Modern On-Chip Interconnects: A Fdtd Approach (Springerbriefs in Applied Sciences and Technology) (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

B.K. Kaushik; V. Ramesh Kumar; Amalendu Patnaik

Año

2016

Idioma

Inglés

N° páginas

116

Encuadernación

Tapa Blanda

ISBN13

9789811007996

N° edición

Categorías

Electrónica: circuitos y componentes

Crosstalk in Modern On-Chip Interconnects: A Fdtd Approach (Springerbriefs in Applied Sciences and Technology) (en Inglés)

B.k. Kaushik; V. Ramesh Kumar; Amalendu Patnaik (Autor) · Springer · Tapa Blanda

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Reseña del libro "Crosstalk in Modern On-Chip Interconnects: A Fdtd Approach (Springerbriefs in Applied Sciences and Technology) (en Inglés)"

The book provides accurate FDTD models for on-chip interconnects, covering most recent advancements in materials and design. Furthermore, depending on the geometry and physical configurations, different electrical equivalent models for CNT and GNR based interconnects are presented. Based on the electrical equivalent models the performance comparison among the Cu, CNT and GNR-based interconnects are also discussed in the book. The proposed models are validated with the HSPICE simulations. The book introduces the current research scenario in the modeling of on-chip interconnects. It presents the structure, properties, and characteristics of graphene based on-chip interconnects and the FDTD modeling of Cu based on-chip interconnects. The model considers the non-linear effects of CMOS driver as well as the transmission line effects of interconnect line that includes coupling capacitance and mutual inductance effects. In a more realistic manner, the proposed model includes the effect of width-dependent MFP of the MLGNR while taking into account the edge roughness.