Name: Fundamental Principles of Engineering Nanometrology (en Inglés)
Price: 153520.00 CLP
Availability: InStock
Author: Leach, Richard
ISBN: 9781455777532

portada Fundamental Principles of Engineering Nanometrology (en Inglés)

Formato

Libro Físico

Autor

Richard Leach

Editorial

William Andrew

Año

2014

Idioma

Inglés

N° páginas

384

Encuadernación

Tapa Dura

Dimensiones

23.9 x 19.3 x 2.3 cm

Peso

1.02 kg.

ISBN13

9781455777532

N° edición

0002

Categorías

Ingeniería: general
Producción e ingeniería industrial
Ciencia, ingeniería y tecnología medioambientales

Fundamental Principles of Engineering Nanometrology (en Inglés)

Richard Leach (Autor) · William Andrew · Tapa Dura

Libro Físico

$ 153.520

$ 255.860

Ahorras: $ 102.340

40% descuento

Envío normal

Origen: Reino Unido (Costos de importación incluídos en el precio)

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Reseña del libro "Fundamental Principles of Engineering Nanometrology (en Inglés)"

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology.