Name: Soft Computing in Condition Monitoring and Diagnostics of Electrical and Mechanical Systems: Novel Methods for Condition Monitoring and Diagnostics (Advances in Intelligent Systems and Computing) (en Inglés)
Price: 180800.00 CLP
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ISBN: 9789811515316

portada Soft Computing in Condition Monitoring and Diagnostics of Electrical and Mechanical Systems: Novel Methods for Condition Monitoring and Diagnostics (Advances in Intelligent Systems and Computing) (en Inglés)

Formato

Libro Físico

Editorial

Springer

Año

1096

Idioma

Inglés

N° páginas

496

Encuadernación

Tapa Dura

ISBN13

9789811515316

N° edición

Categorías

Inteligencia artificial

Soft Computing in Condition Monitoring and Diagnostics of Electrical and Mechanical Systems: Novel Methods for Condition Monitoring and Diagnostics (Advances in Intelligent Systems and Computing) (en Inglés)

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Reseña del libro "Soft Computing in Condition Monitoring and Diagnostics of Electrical and Mechanical Systems: Novel Methods for Condition Monitoring and Diagnostics (Advances in Intelligent Systems and Computing) (en Inglés)"

This book addresses a range of complex issues associated with condition monitoring (CM), fault diagnosis and detection (FDD) in smart buildings, wide area monitoring (WAM), wind energy conversion systems (WECSs), photovoltaic (PV) systems, structures, electrical systems, mechanical systems, smart grids, etc. The book’s goal is to develop and combine all advanced nonintrusive CMFD approaches on a common platform. To do so, it explores the main components of various systems used for CMFD purposes.The content is divided into three main parts, the first of which provides a brief introduction, before focusing on the state of the art and major research gaps in the area of CMFD. The second part covers the step-by-step implementation of novel soft computing applications in CMFD for electrical and mechanical systems. In the third and final part, the simulation codes for each chapter are included in an extensive appendix to support newcomers to the field.