Name: Software Quality Management: Reducing Defect Through Root Cause Analysis (en Inglés)
Price: 41630.00 CLP
Availability: InStock
Author: Abusayed Mahfuz
ISBN: 9781708191863

portada Software Quality Management: Reducing Defect Through Root Cause Analysis (en Inglés)

Formato

Libro Físico

Editorial

Independently Published

Autor

Abusayed Mahfuz

Año

2020

Idioma

Inglés

N° páginas

200

Encuadernación

Tapa Blanda

ISBN13

9781708191863

Categorías

Tecnologías educativas

Software Quality Management: Reducing Defect Through Root Cause Analysis (en Inglés)

Abusayed Mahfuz (Autor) · Independently Published · Tapa Blanda

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Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Software Quality Management: Reducing Defect Through Root Cause Analysis (en Inglés)"

Content OverviewChapter One: Software Development Life Cycle, includes the Concept and Definition includes two major development process of Waterfall and Agile. Chapter Two: ‘Software Testing Life Cycle, includes concept and definition of Testing, its life cycle and how it fits in Software Development Life Cycle. This chapter also discuss the different kind of testing. Chapter Three: ‘Test Planning and Designing’ provides hands of guideline about Test Planning, Software Testing Life Cycle, and Kinds/Types of Testing. Chapter Three “Testing: Plan and Design” includes requirement analysis, Test Case specificationChapter Four: ‘Functional Testing’ includes major components of functional testing including Automation testing, end to end testing and best automated testing tools. Chapter Five: ‘Non-Functional Testing’ discusses about major nonfunctional testing including ‘Security Testing’, ‘Installation Testing’, and ‘Performance Testing’.Chapter Six: ‘Test Execution’ discusses Test execution preparation such as data gathering and data set up, Entry-Exit criteria, Test Result Reporting.Chapter Seven: ‘Defect Management’ addresses the definition and analysis of defects and defect management process of how to reduce and prevent defect in the future. Chapter Eight: ‘Potential Defect’ addressed the discussing any incident that may cause an error or quality concern.Chapter Nine: ‘Critical Defect’ which addresses the Critical Defects which includes Risk and Vulnerably, which may also cause information security issue. Chapter Ten: ‘Root Cause Analysis’ discusses the root causes